Measurement of U and Pu concentration by X-ray fluorescence spectrometry using vertical irradiation system.

; ; ; Ikeda, Hisashi ; Jitsukata, Shu*; *

JNC TN8410 2000-022, 55 Pages, 2000/05

JNC-TN8410-2000-022.pdf:1.57MB

Measurement of U and Pu concentrations by wavelength dispersion type X-ray fluorescence spectrometry was studied. Sample holder was installed inside of glove box and other instruments, X-ray tube, monochromator and detectors were set out side of the glove box. X-rays was irradiated to sample though Be window. Fluorescent X-rays form sample were also passing though the same Be window and detected outside. Analytical conditions were optimized as follows. Sample thickness is 8 mm, which is 3ml of sample volume by the sample holder. Voltage and eurrent for X-ray tube is 50kV and 40 mA, respectively. Measurement was done twice, 60 seconds each, and averaged X-ray intensity was used to calculate elemental concentrations. Matrix correction was necessary to measure U and Pu concentration within 10% accuracy. Detection limits were calculated to 0.4 mg/L for U and 0.7mg/L for Pu. Calibration curve was liner up to 9 g/L fbr U and Pu. Two calculation methods, calibration curve method and standard addition method, were studied to measure Pu concentration in organic solution. Detection limit was 5.3 mg/L and 0.2 mg/L, respectively.